Convolutional Neural Network Models for Scattering Pattern Recognition of Scanning Electron Microscopy Images

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Phankokkruad, Manop and Wacharawichanant, Sirirat (2018) Convolutional Neural Network Models for Scattering Pattern Recognition of Scanning Electron Microscopy Images In: 2018 5th International Conference on Computational Science/Intelligence and Applied Informatics (CSII), 2018-07-10, Yonago, Japan.

Abstract

The following topics are dealt with: neural nets; video signal processing; music; smart phones; Internet; learning (artificial intelligence); natural language processing; video retrieval; face recognition; emotion recognition.

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Conference or Workshop Item (Paper)

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Deposited by:

ระบบ อัตโนมัติ

Date Deposited:

2021-09-09 23:53:44

Last Modified:

2021-09-26 07:16:15

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